ION-TOF GmbH
ION-TOF is the leading European manufacturer of Time-of-Flight Secondary Ion Mass Spectrometers
(TOF-SIMS) for surface analysis. The company was founded by Prof. Alfred Benninghoven, Dr. Ewald
Niehuis and Mr. Thomas Heller in 1989 to commercialise the original research carried out by Prof.
Benninghoven and his team at the University of Muenster in Germany from the early 80’s. Since the
original conception, the contribution of Muenster by its academics and entrepreneurs to the development
and spread of the TOF-SIMS technique has been significant and unceasing. Muenster is certainly the
place to visit if you want to know the latest about TOF-SIMS. TOF-SIMS has become a standard requirement
for a surface analysis laboratory, and has overtaken other longer established surface techniques,
both in the performance and the number of units now being sold.
Since the technique became commercially viable ION-TOF has made many product improvements, and
more than 100 instruments are in operation in industrial and academic laboratories worldwide. IONTOF’s
success is based on the longstanding SIMS experience and skills of our scientists and engineers,
the support given to our customers and the close cooperation with them, and a dedication to supply a
good, efficient product to match the demands of the modern users.
ION-TOF’s engineers are not solely involved in developing equipment; basic research is also carried out.
Consequently ION-TOF is part of the national German competence centre “nanoanalytics”. The IONTOF
premises are in a science park close to the University, the Technologiehof, the Centre for
Nanotechnology ( CeNTech ) and the Max-Planck Institute for Cell Biology, which is practical for collaboration
and provides a stimulating working environment.
The involvement in nanoscience projects enables us to understand the instrumental requirements for
nanoscience and design them into our instruments. ION-TOF is also an important partner in many other
national and international surface science projects.
ION-TOF continues to make considerable development effort. Its policy to build the most innovative ion
beam technology for surface science, and the continued investment in the development of our instruments
will produce new instruments with even better performance.
In particular ION-TOF works in close co-operation with its sister company TASCON, located in the
same building, set up to provide analytical services, and provide demonstration and applications facilities.
The co-operation with TASCON’s applications experts enables us to investigate new applications
for the TOF-SIMS technique to expand its use even further.
